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Tabletop Scanning Electron Microscope SH-3000: Fast, Easy and Powerful Observation

New HIROX Tabletop Mini-SEM: Desktop Scanning Electron
Microscope with integrated EDS BRUKER-AXS!
Easy to use, fast, performant and easy maintenance,
the HIROX Mini-SEM combines the simplicity of an optical
microscope with the strength of a Scanning Electron Microscope!

Compact and powerful SEM

Hirox, specialist in digital video microscopy, set a new standard in desktop SEM.

This Mini-SEM is a bridge between the world of optical microscopy and scanning electron microscopy.
As simple as a video camera, the Mini-SEM can be used by anyone. The software interface is user friendly and the automatic features (Auto Adjust or Auto Focus) makes this tool a fast but strong investigation tool.

Easy to install, mobile, this high-tech and compact system covers a large magnification range usually enough for the visualization and control of most samples.

From 20x to 30 000X

Visualization
Measurements
Control
Output

... in just a few seconds!

Integration of a EDS system from BRUKER-AXS

Additionally to the sample visualization, you can also collect automatic element identification information.
Thanks to the SDD technology from Bruker, identify and quantify the chemical composition with a single mouse click !
From boron to uranium, the azotes free and no maintenance SDD detector features a stable resolution up to 100 000 cps!
Finally the Hirox mini SEM offers a very accurate analysis from any spot.

Integrated EDS system for microanalysis: Simple or spectral mapping and profiling in option	Line profiles Element intensity along a line. Clear correspondence between zoomed image along the line and element line profile)

EDS Software Specifications

BRUKER QUANTAX 410M

Basic system X410M1

SDD XFlash 410 Detector (133 eV @ Mn Kalpha)
Maintenance free Peltier cooled detector
Detection from boron up to uranium
Automatic element identification
Qualitative Analysis in spotlight mode or scanning mode
Quantitative standardless Analysis with correction for rough samples

Advanced system X410M2

Vision : picture image processing and enhancement
Point and Multipoint (automatic multipoint and object analysis)
Ultra fast element line profile
Ultra fast digital element mapping

Options

Integrated result presentation and report generation
Quantitative analysis with standards HSQuant, (Phi(rho,z))...
Spectral Mapping
Real time correction of beam shift
Automatic particle analysis
Automatic phase analysis

SEM Specifications

SEM Technical specs

Extremely easy to use and user friendly software
Very fast sample change: vacuum in less than 3 minutes!
Automatically parameter recording
Magnification from 20x to 30 000x
3 axis table X,Y,R
Working distance from 10 to 15 mm
Tungsten Filament (including with 6 pre mounted filaments)
High Voltage from 1 to 30 kV (5 kV steps)
Picture resolution 1280x960 or 2560x1920
Measurement: area, dimensions, angle, etc.
Display on screen: scale, voltage, magnification
4 scanning modes (2 visualization, 2 picture recording)
"Bean Shift Coil" : easily move the viewing area precisely with software control (very useful when observing at high magnification)
"Gun Align Coil software control: precisely perform gun alignment after hardware aligning
Compact dimensions : 70 kg, 49cm x 52cm x 54 cm

Laptop or Desktop PC specs

2.4 GHz processor with 2 Go RAM
HDD 160 Go
LCD screen 22" (or 17" laptop)
Windows XP

Options

Table/metal cupboard with wheels
Backscattered electron detector
Motorized XY axis
Cooling stage (Peltier)
EDS system (see above)

Access to all the analysis possibilities from a very powerful EDS system: profiling, mapping, spectral mapping with image shift correction... The Hirox mini SEM is perfectly suited for elementary analysis thanks to the variable High Voltage: from 1 to 30 kV.
Phase analysis, particles search, filter analysis and much more... all those tools are also available!